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Characterization of High Tc Materials and Devices by Electron Microscopy

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Characterization of High Tc Materials and Devices by Electron Microscopy

A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.

Nigel D. Browning (Edited by), Stephen J. Pennycook (Edited by)

9780521031707, Cambridge University Press

Paperback / softback, published 23 November 2006

408 pages

24.3 x 16.8 x 2.1 cm, 0.669 kg

'\u2026 a useful and nearly comprehensive guide to current work in the subject.' J. P. Davey, Contemporary Physics

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapte]

Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy

A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.

Nigel D. Browning (Edited by), Stephen J. Pennycook (Edited by)

9780521031707, Cambridge University Press

Paperback / softback, published 23 November 2006

408 pages

24.3 x 16.8 x 2.1 cm, 0.669 kg

'\u2026 a useful and nearly comprehensive guide to current work in the subject.' J. P. Davey, Contemporary Physics

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapte]

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